Antrix AWM
Sub-pixel accuracy.Proven.
The one number that matters
Everyopticalmeasurementsystemlivesordiesonhowpreciselyitcanlocateanedge.AntrixAWMfindsedge,holeandgapboundariestoasmallfractionofapixel,evenonnoisyimagesandclosely-spacededges.
Why it matters
Where others fail,
it holds.
Best overall accuracy. No calibration.
Lowest combined bias + noise error of any tested method on straight edges, curves and corners, down to 0.26 px expanded uncertainty.
Closely-spaced edges.
Bore holes, slots, thin features. Stays accurate where classical moment methods break down.
~20% lower uncertainty.
Measurably better than the previous best-in-class method on two-edge and narrow geometries.
Sub-micron-class repeatability.
Pixel-locking bias sits at the noise floor. No systematic error tied to where an edge falls within a pixel.
Measured accuracy
Validated,
not estimated.
The figures
The benchmark,
visualized.




Where it fits
Inside every
Antrix measurement.
Special thanks
With gratitude to our mentor.

Dr. Ajay M. Patel
Assistant Professor
G.H. Patel College of Engineering and Technology
Put AWM
to the test.
Integrate Antrix AWM into your inspection pipeline, or license the measurement engine directly.